发明名称 |
Semiconductor device having V-shaped region |
摘要 |
Among other things, a semiconductor device or transistor and a method for forming the semiconductor device are provided for herein. The semiconductor device comprises one or more v-shaped recesses in which stressed monocrystalline semiconductor material, such as silicon germanium, is grown, to form at least one of a source or a drain of the semiconductor device. The one or more v-shaped recesses are etched into a substrate in-situ. The semiconductor device comprises at least one of a source or a drain having a height-to-length ratio exceeding at least 1.6 when poly spacing between a first part of the semiconductor device (e.g., first transistor) and a second part of the semiconductor device (e.g., second transistor) is less than about 60 nm. |
申请公布号 |
US9269812(B2) |
申请公布日期 |
2016.02.23 |
申请号 |
US201514600095 |
申请日期 |
2015.01.20 |
申请人 |
Taiwan Semiconductor Manufacturing Company Limited |
发明人 |
Chen Chao-Hsuing;Wang Ling-Sung;Lin Chi-Yen |
分类号 |
H01L29/78;H01L21/36;H01L21/8238;H01L29/66;H01L29/06;H01L29/165;H01L27/092;H01L29/10;H01L29/161 |
主分类号 |
H01L29/78 |
代理机构 |
Cooper Legal Group, LLC |
代理人 |
Cooper Legal Group, LLC |
主权项 |
1. A transistor, comprising:
a source/drain region having a height-to-length ratio exceeding at least 1.5 when a poly spacing between the transistor and a second transistor is less than about 75 nm and having a height-to-length ratio exceeding at least 1.6 when the poly spacing between the transistor and the second transistor is less than about 60 nm. |
地址 |
Hsin-Chu TW |