发明名称 |
Stacked semiconductor die assemblies with improved thermal performance and associated systems and methods |
摘要 |
Stacked semiconductor die assemblies with improved thermal performance and associated systems and methods are disclosed herein. In one embodiment, a semiconductor die assembly can include a stack of semiconductor dies and a thermally conductive casing at least partially enclosing the stack of semiconductor dies within an enclosure. A package substrate carries the thermally conductive casing, and an interposer is disposed between the thermally conductive casing and the stack of semiconductor dies. A peripheral portion of the interposer extends laterally beyond the stack of semiconductor dies and is coupled to a plurality of conductive members interposed between the peripheral portion and the package substrate. |
申请公布号 |
US9269700(B2) |
申请公布日期 |
2016.02.23 |
申请号 |
US201414231101 |
申请日期 |
2014.03.31 |
申请人 |
MICRON TECHNOLOGY, INC. |
发明人 |
Koopmans Michel;Luo Shijian;Hembree David R. |
分类号 |
H01L23/02;H01L25/18;H01L23/34;H01L23/00;H01L25/00 |
主分类号 |
H01L23/02 |
代理机构 |
Perkins Cole LLP |
代理人 |
Perkins Cole LLP |
主权项 |
1. A semiconductor die assembly, comprising:
a stack of semiconductor dies having a vertical height; a thermally conductive casing; an interposer between the thermally conductive casing and the stack of semiconductor dies, wherein a peripheral portion of the interposer extends laterally beyond the stack of semiconductor dies; a package substrate carrying the thermally conductive casing; and a plurality of conductive members interposed between the package substrate and the peripheral portion of the interposer, wherein each of the conductive members includes a solder bump having a vertical height that is about equal to or greater than the vertical height of the stack of semiconductor dies. |
地址 |
Boise ID US |