Particle capture device

摘要

In example embodiments, particle collection efficiency in aerosol analyzers and other particle measuring instruments is improved by a particle capture device that employs multiple collisions to decrease momentum of particles until the particles are collected (e.g., vaporized or come to rest). The particle collection device includes an aperture through which a focused particle beam enters. A collection enclosure is coupled to the aperture and has one or more internal surfaces against which particles of the focused beam collide. One or more features are employed in the collection enclosure to promote particles to collide multiple times within the enclosure, and thereby be vaporized or come to rest, rather than escape through the aperture.

主权项

1. A particle capture device for capturing micron and/or sub-micron sized particles in an instrument, comprising:
an aperture through which a focused particle beam including micron and/or sub-micron particles enters the particle capture device; a collection enclosure coupled to the aperture and into which the focused particle beam is received, the collection enclosure having one or more internal surfaces upon which the particles collide multiple times until the particles are vaporized or come to rest for subsequent vaporization, the one or more internal surfaces including a first internal surface arranged in an initial trajectory of the focused particle beam to receive an initial collision of particles, the first internal surface orientated at an angle with respect to the initial trajectory, the angle sufficient to provide that the initial collision reduces momentum of the particles but preserves a direction of a forward velocity vector component of the particles; and a temperature control element configured to heat and/or cool the collection enclosure.