发明名称 |
Multilayer wiring base plate and probe card using the same |
摘要 |
A multilayer wiring base plate includes an insulating plate including a plurality of synthetic resin layers made of an insulating material, a wiring circuit provided in the insulating plate, a thin-film resistor formed along at least one of the synthetic resin layers to be buried in the synthetic resin layer and inserted in the wiring circuit, and a heat expansion and contraction restricting layer formed to be buried in the synthetic resin layer adjacent to the synthetic resin layer in which the thin-film resistor is formed to be buried, arranged along the thin-film resistor, and having a smaller linear expansion coefficient than a linear expansion coefficient of the adjacent synthetic resin layers. |
申请公布号 |
US9271393(B2) |
申请公布日期 |
2016.02.23 |
申请号 |
US201313943618 |
申请日期 |
2013.07.16 |
申请人 |
Kabushiki Kaisha Nihon Micronics |
发明人 |
Otabe Noboru;Omori Toshinori;Sugai Takayasu |
分类号 |
G01R31/00;H05K1/02;H05K1/16 |
主分类号 |
G01R31/00 |
代理机构 |
Ingrassia Fisher & Lorenz, P.C. |
代理人 |
Ingrassia Fisher & Lorenz, P.C. |
主权项 |
1. A multilayer wiring base plate comprising:
an insulating plate including a plurality of insulating synthetic resin layers; a wiring circuit provided in the insulating plate; a thin-film resistor formed along one of the synthetic resin layers to be buried in the synthetic resin layers and inserted in the wiring circuit; and a heat expansion and contraction restricting layer formed to be buried in the synthetic resin layers adjacent to the one of the synthetic resin layers along which the thin-film resistor is formed, and having a smaller linear expansion coefficient than a linear expansion coefficient of the adjacent synthetic resin layers; wherein the heat expansion and contraction restricting layer is arranged to be approximately parallel to the thin-film resistor and extends outward and beyond an arranging area of the thin-film resistor, and wherein the heat expansion and contraction restricting layer is made of a metal material and is electrically insulated from the wiring circuit; wherein both ends of the thin-film resistor are electrically connected to connection electrodes as a pair connected to the wiring circuit, respectively, and the connection electrodes as a pair cover respective corresponding end portions and edges of the thin-film resistor; and wherein the respective connection electrodes have on mutually opposed surfaces thereof step portions respectively receiving the corresponding end portions and edges of the thin-film resistor and are electrically and mechanically coupled with both the corresponding end portions and edges of the thin-film resistor by the opposed step portions. |
地址 |
Musashino-shi, Tokyo JP |