| 摘要 |
Disclosed is a computer system provided with a plurality of sensors provided in a plurality of devices to observe a predetermined amount, and a server for examining the physical amount transmitted from the sensors, wherein the plurality of devices are classified into a first device group and a plurality of second device groups, a plurality of second examination rules indicating the examination methods of the physical amount are set in the plurality of second device groups, the server calculates the similarity between the first device group and each of the second device groups, and, on the basis of the calculated similarity, a first examination rule to be set in the first device group is extracted from the plurality of second examination rules set in the plurality of second device groups. |
| 主权项 |
1. A computer system, comprising:
a plurality of sensors mounted in a plurality of devices to measure specified physical quantities; and a server configured to examine the physical quantities sent from the sensors, wherein the devices are classified into a first device group, and a plurality of second device groups, wherein the second device groups include a plurality of second examination rules showing examination methods for the physical quantities, wherein the server includes a storage device, wherein the server is configured to store, in the storage device, an attribute which indicates types of the plurality of devices and types of the physical quantities measured by the sensors, and store sensor information of devices, the sensor information including an attribute value of the attribute, regarding the first device group and the second device groups, wherein the server is configured to store, in the storage device, examination information indicating the second examination rules included in the second device groups, wherein the server is configured to calculate a similarity coefficient of the attribute, wherein the server is configured to calculate, by using the sensor information, similarities between each device in the first device group and each device in the second device group, by obtaining multipliers from the calculated similarity coefficient of the attribute and an attribute distance for each attribute and summing the obtained multipliers, the attribute distance being calculated based on the difference between an attribute value of each device in the first device group and an attribute value of each device in the second device groups, wherein the server is configured to calculate a similarity between the first device group and each of the second device groups based on the similarities between each device in the first device group and each device in the second device groups, and wherein the server is configured to extract a first examination rule to be set in the first device group from the second examination rules, which are indicated by the examination information and set in the second device groups, on the calculated similarity between the first device group and each of the second device groups. |
