发明名称 Semiconductor device and method for producing the same
摘要 A power semiconductor device comprises a first substrate that is highly doped with a first dopant type, the first substrate having a front face and a back face, the back face forming a backside of the device, a vertical p-type FET and a vertical n-type FET provided laterally adjacent to each other on the front face of the first substrate, wherein one of the FETs has a first drift zone with a complementary doping to the first dopant of the first substrate, and wherein the p-type FET and the n-type FET share the first substrate as a common backside, and wherein a region between the first drift zone and the first substrate comprises a highly conductive structure providing a low ohmic connection between the first drift zone and the first substrate. Further, a method for producing such a device is provided.
申请公布号 US9269713(B2) 申请公布日期 2016.02.23
申请号 US201313909726 申请日期 2013.06.04
申请人 Infineon Technologies Austria AG 发明人 Irsigler Peter;Hirler Franz;Schulze Hans-Joachim
分类号 H01L27/092;H01L21/8238 主分类号 H01L27/092
代理机构 Murphy, Bilak & Homiller, PLLC 代理人 Murphy, Bilak & Homiller, PLLC
主权项 1. A power semiconductor device comprising: a first substrate that is highly doped with a first dopant type, the first substrate having a front face and a back face, the back face forming a backside of the device, a vertical p-type FET and a vertical n-type FET provided laterally adjacent to each other on the front face of the first substrate, wherein a first of the vertical FETs has a first drift zone and a second of the vertical FETs has a complementary second drift zone with a complementary doping to the first dopant of the first substrate, and a complementary highly doped second region provided between the complementary second drift zone and the first substrate, wherein the p-type FET and the n-type FET share the first substrate as a common backside, and wherein a region between the complementary second drift zone and the first substrate, including at least a part of the complementary highly doped second region, comprises a highly conductive structure providing a low ohmic connection between the complementary second drift zone and the first substrate.
地址 Villach AT