发明名称 |
Semiconductor memory device and sense amplifier control method thereof |
摘要 |
A semiconductor memory device is provided. A cell array includes a DRAM cell connected to one of a pair of bit lines. A bit line sense amplifier is coupled to the pair of bit lines. The bit line sense amplifier discharges a low-level bit line of the pair of bit lines toward a ground level and clamps the low-level bit line to a boosted sense ground voltage in response to a control signal. A sense amplifier control logic generates the control signal having a pulse interval. The low-level bit line is discharged toward the ground level for the pulse interval and after the pulse interval ends, the low-level bit line is clamped to the boosted sense ground voltage. |
申请公布号 |
US9269420(B2) |
申请公布日期 |
2016.02.23 |
申请号 |
US201414253353 |
申请日期 |
2014.04.15 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
Chun Kichul;Yoon Hyun-Chul |
分类号 |
G11C11/24;G11C11/4094;G11C11/404;G11C11/405;G11C11/4091;G11C11/4074 |
主分类号 |
G11C11/24 |
代理机构 |
F. Chau & Associates, LLC |
代理人 |
F. Chau & Associates, LLC |
主权项 |
1. A semiconductor memory device comprising:
a cell array including a DRAM cell connected to one of a pair of bit lines; a bit line sense amplifier coupled to the pair of bit lines and discharging a low-level bit line of the pair of bit lines toward a ground level during an initial period of sensing operation, clamping the low-level bit line to a boosted sense ground voltage in response to a control signal, and pulling up a high-level bit line of the pair of bit lines toward a core supply voltage level; and a sense amplifier control logic generating the control signal having a pulse interval, wherein the low-level bit line is discharged toward the ground level for the pulse interval and after the pulse interval ends, the low-level bit line is clamped to the boosted sense ground voltage. |
地址 |
Suwon-Si, Gyeonggi-Do KR |