发明名称 Semiconductor memory device and sense amplifier control method thereof
摘要 A semiconductor memory device is provided. A cell array includes a DRAM cell connected to one of a pair of bit lines. A bit line sense amplifier is coupled to the pair of bit lines. The bit line sense amplifier discharges a low-level bit line of the pair of bit lines toward a ground level and clamps the low-level bit line to a boosted sense ground voltage in response to a control signal. A sense amplifier control logic generates the control signal having a pulse interval. The low-level bit line is discharged toward the ground level for the pulse interval and after the pulse interval ends, the low-level bit line is clamped to the boosted sense ground voltage.
申请公布号 US9269420(B2) 申请公布日期 2016.02.23
申请号 US201414253353 申请日期 2014.04.15
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 Chun Kichul;Yoon Hyun-Chul
分类号 G11C11/24;G11C11/4094;G11C11/404;G11C11/405;G11C11/4091;G11C11/4074 主分类号 G11C11/24
代理机构 F. Chau & Associates, LLC 代理人 F. Chau & Associates, LLC
主权项 1. A semiconductor memory device comprising: a cell array including a DRAM cell connected to one of a pair of bit lines; a bit line sense amplifier coupled to the pair of bit lines and discharging a low-level bit line of the pair of bit lines toward a ground level during an initial period of sensing operation, clamping the low-level bit line to a boosted sense ground voltage in response to a control signal, and pulling up a high-level bit line of the pair of bit lines toward a core supply voltage level; and a sense amplifier control logic generating the control signal having a pulse interval, wherein the low-level bit line is discharged toward the ground level for the pulse interval and after the pulse interval ends, the low-level bit line is clamped to the boosted sense ground voltage.
地址 Suwon-Si, Gyeonggi-Do KR