发明名称 Defect management systems and methods
摘要 Defect management systems and methods are disclosed. A system for managing defects on an object includes an automatic defect classification (ADC) module, a lithographic plane review (LPR) module, and a defect progression monitor (DPM) module in communication with the ADC module and the LPR module. The DPM module is adapted to obtain information regarding a defect disposed on the object from the ADC module and the LPR module and determine if a repair or cleaning is needed of the object.
申请公布号 US9269135(B2) 申请公布日期 2016.02.23
申请号 US201213410190 申请日期 2012.03.01
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Tien Yan-Wei;Su Pei-Yi;Huang You-Hong;Wang Ching-Cheng
分类号 G06F19/00;G06K9/00;G06T7/00 主分类号 G06F19/00
代理机构 Slater & Matsil, L.L.P. 代理人 Slater & Matsil, L.L.P.
主权项 1. A system for managing defects on an object, the system comprising: a processor; and a non-transitory computer readable storage medium storing programming for execution by the processor, the programming including instructions for: performing an automatic defect classification (ADC) algorithm;performing a lithographic plane review (LPR) algorithm, the LPR algorithm adapted to create a simulation image of an image of the object and perform an overlay comparison of the simulation image with an image file of a pattern layout file; andperforming a defect progression monitor (DPM) algorithm, the DPM algorithm adapted to obtain information regarding a defect disposed on the object from the ADC algorithm and the LPR algorithm and determine if a repair or cleaning is needed of the object.
地址 Hsin-Chu TW