发明名称 |
Defect management systems and methods |
摘要 |
Defect management systems and methods are disclosed. A system for managing defects on an object includes an automatic defect classification (ADC) module, a lithographic plane review (LPR) module, and a defect progression monitor (DPM) module in communication with the ADC module and the LPR module. The DPM module is adapted to obtain information regarding a defect disposed on the object from the ADC module and the LPR module and determine if a repair or cleaning is needed of the object. |
申请公布号 |
US9269135(B2) |
申请公布日期 |
2016.02.23 |
申请号 |
US201213410190 |
申请日期 |
2012.03.01 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Tien Yan-Wei;Su Pei-Yi;Huang You-Hong;Wang Ching-Cheng |
分类号 |
G06F19/00;G06K9/00;G06T7/00 |
主分类号 |
G06F19/00 |
代理机构 |
Slater & Matsil, L.L.P. |
代理人 |
Slater & Matsil, L.L.P. |
主权项 |
1. A system for managing defects on an object, the system comprising:
a processor; and a non-transitory computer readable storage medium storing programming for execution by the processor, the programming including instructions for:
performing an automatic defect classification (ADC) algorithm;performing a lithographic plane review (LPR) algorithm, the LPR algorithm adapted to create a simulation image of an image of the object and perform an overlay comparison of the simulation image with an image file of a pattern layout file; andperforming a defect progression monitor (DPM) algorithm, the DPM algorithm adapted to obtain information regarding a defect disposed on the object from the ADC algorithm and the LPR algorithm and determine if a repair or cleaning is needed of the object. |
地址 |
Hsin-Chu TW |