发明名称 |
Leakage measurement systems |
摘要 |
Described examples include leakage measurement systems and methods for measuring leakage current between a word line at a boosted voltage and a word line at a supply voltage. The boosted voltage may be generated by charge pump circuitry. Examples of leakage measurement systems described herein may be included in memory devices. |
申请公布号 |
US9269410(B2) |
申请公布日期 |
2016.02.23 |
申请号 |
US201414584584 |
申请日期 |
2014.12.29 |
申请人 |
Micron Technology, Inc. |
发明人 |
Yamada Shigekazu |
分类号 |
G11C7/06;G11C29/02;G11C29/50;G11C16/00;G11C16/04;G11C29/12 |
主分类号 |
G11C7/06 |
代理机构 |
Dorsey & Whitney LLP |
代理人 |
Dorsey & Whitney LLP |
主权项 |
1. An apparatus, comprising:
a current source configured to be coupled between a supply voltage and a reference voltage, wherein the current source is configured to provide a reference current to a first word line; and a comparator having a first input configured to receive the supply voltage and a second input coupled to the first word line, wherein the comparator is configured to generate a signal indicative of a comparison between the supply voltage and a voltage on the first word line. |
地址 |
Boise ID US |