发明名称 Leakage measurement systems
摘要 Described examples include leakage measurement systems and methods for measuring leakage current between a word line at a boosted voltage and a word line at a supply voltage. The boosted voltage may be generated by charge pump circuitry. Examples of leakage measurement systems described herein may be included in memory devices.
申请公布号 US9269410(B2) 申请公布日期 2016.02.23
申请号 US201414584584 申请日期 2014.12.29
申请人 Micron Technology, Inc. 发明人 Yamada Shigekazu
分类号 G11C7/06;G11C29/02;G11C29/50;G11C16/00;G11C16/04;G11C29/12 主分类号 G11C7/06
代理机构 Dorsey & Whitney LLP 代理人 Dorsey & Whitney LLP
主权项 1. An apparatus, comprising: a current source configured to be coupled between a supply voltage and a reference voltage, wherein the current source is configured to provide a reference current to a first word line; and a comparator having a first input configured to receive the supply voltage and a second input coupled to the first word line, wherein the comparator is configured to generate a signal indicative of a comparison between the supply voltage and a voltage on the first word line.
地址 Boise ID US