发明名称 Multi-gate MOSFET with embedded isolation structures
摘要 A multi-gate MOSFET includes a substrate, a dielectric layer and at least a fin-shaped structure. The substrate has a first area and a second area. The dielectric layer is only located in the substrate of the first area. At least a fin-shaped structure is located on the dielectric layer. Moreover, the present invention also provides a multi-gate MOSFET process forming said multi-gate MOSFET.
申请公布号 US9269791(B2) 申请公布日期 2016.02.23
申请号 US201213545967 申请日期 2012.07.10
申请人 UNITED MICROELECTRONICS CORP. 发明人 Fu Ssu-I;Liou En-Chiuan;Yang Chih-Wei;Chen Ying-Tsung;Tsai Shih-Hung
分类号 H01L27/088;H01L29/66;H01L29/78;H01L21/336 主分类号 H01L27/088
代理机构 代理人 Hsu Winston;Margo Scott
主权项 1. A multi-gate MOSFET, comprising: a substrate having a first area and a second area; a dielectric layer being a single layer only located in the substrate in the first area; at least a fin-shaped structure located on the dielectric layer, wherein a part of the dielectric layer directly below the fin-shaped structure protrudes from a part of the dielectric layer beside the fin-shaped structure; a liner located only on a part of sidewalls of the fin-shaped structure without contacting the dielectric layer; and an isolation structure located on the dielectric layer and surrounding the fin-shaped structure, wherein a top surface of the liner is trimmed with a top surface of the isolation structure, wherein the isolation structure and the dielectric layer have an interface between them.
地址 Science-Based Industrial Park, Hsin-Chu TW