发明名称 |
Multi-gate MOSFET with embedded isolation structures |
摘要 |
A multi-gate MOSFET includes a substrate, a dielectric layer and at least a fin-shaped structure. The substrate has a first area and a second area. The dielectric layer is only located in the substrate of the first area. At least a fin-shaped structure is located on the dielectric layer. Moreover, the present invention also provides a multi-gate MOSFET process forming said multi-gate MOSFET. |
申请公布号 |
US9269791(B2) |
申请公布日期 |
2016.02.23 |
申请号 |
US201213545967 |
申请日期 |
2012.07.10 |
申请人 |
UNITED MICROELECTRONICS CORP. |
发明人 |
Fu Ssu-I;Liou En-Chiuan;Yang Chih-Wei;Chen Ying-Tsung;Tsai Shih-Hung |
分类号 |
H01L27/088;H01L29/66;H01L29/78;H01L21/336 |
主分类号 |
H01L27/088 |
代理机构 |
|
代理人 |
Hsu Winston;Margo Scott |
主权项 |
1. A multi-gate MOSFET, comprising:
a substrate having a first area and a second area; a dielectric layer being a single layer only located in the substrate in the first area; at least a fin-shaped structure located on the dielectric layer, wherein a part of the dielectric layer directly below the fin-shaped structure protrudes from a part of the dielectric layer beside the fin-shaped structure; a liner located only on a part of sidewalls of the fin-shaped structure without contacting the dielectric layer; and an isolation structure located on the dielectric layer and surrounding the fin-shaped structure, wherein a top surface of the liner is trimmed with a top surface of the isolation structure, wherein the isolation structure and the dielectric layer have an interface between them. |
地址 |
Science-Based Industrial Park, Hsin-Chu TW |