| 摘要 |
The invention describes a testing head (20) for a testing equipment of electronic devices comprising a plurality of contact probes (22) inserted into guide holes being realized in at least one upper guide (23) and in one lower guide (24), and at least one containment element (27) of the probes which is disposed between the upper and lower guides (23, 24), each of the contact probes (22) having at least one terminal portion (25) which ends with a contact tip adapted to abut on a respective contact pad of a device to be tested and projecting from the lower guide (24) with a length (L), the testing head further comprising at least one a spacer element (28) interposed between said containment element (27) and at least one of said upper and lower guides (23, 24), this spacer element (28) being removable in order to adjust the length (L) of the terminal portions (25) of the contact probes (22). |
