发明名称 SUBSTRATE PROCESSING APPARATUS
摘要 While suppressing the amount of supplied coating liquid coated on a substrate in a small amount, the coating liquid is uniformly coated into a substrate surface. A substrate processing apparatus (1) comprises: a moving mechanism (20) which moves a wafer (W) in a horizontal direction; coating units (30, 50) which eject the coating liquid to the wafer (W); dry units (40, 60) which dry the coating liquid on the wafer (W); and a control unit which controls the moving mechanism (20), coating units (30, 50), and dry units (40, 60). In each coating unit (30, 50), the wafer (W) is moved in the horizontal direction while causing the coating liquid to be in contact with the wafer (W) so that the coating liquid is coated on the entire surface of the wafer (W).
申请公布号 KR20160019370(A) 申请公布日期 2016.02.19
申请号 KR20150109443 申请日期 2015.08.03
申请人 TOKYO ELECTRON LIMITED 发明人 WAKAMOTO YUKIHIRO
分类号 H01L21/02;H01L21/67;H01L21/677 主分类号 H01L21/02
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