发明名称 CHEMICAL-MECHANICAL POLISHING COMPOSITION COMPRISING ORGANIC/INORGANIC COMPOSITE PARTICLES
摘要 Described are a chemical-mechanical polishing (CMP) composition comprising abrasive particles in the form of organic/inorganic composite particles as well as the use of said composite particles as abrasive particles in a CMP composition and processes for the manufacture of a semiconductor device comprising chemical mechanical polishing of a substrate in the presence said CMP composition.
申请公布号 WO2016024177(A1) 申请公布日期 2016.02.18
申请号 WO2015IB55608 申请日期 2015.07.24
申请人 BASF SE;BASF (CHINA) COMPANY LIMITED 发明人 LAN, YONGQING;NOLLER, BASTIAN MARTEN;JIANG, LIANG;SHEN, DANIEL KWO-HUNG;GOLZARIAN, REZA;LI, YUZHUO
分类号 C09K3/14;H01L21/304 主分类号 C09K3/14
代理机构 代理人
主权项
地址