发明名称 METHOD FOR PRODUCING DOPING REGIONS IN A SEMICONDUCTOR LAYER OF A SEMICONDUCTOR COMPONENT
摘要 The invention relates to a method for producing doping regions in a semiconductor layer of a semiconductor component, wherein the method comprises the following steps: A) implanting a first dopant of a first doping type into at least one implantation region in the semiconductor layer, which implantation region adjoins a first side of the semiconductor layer; B) applying a doping layer, which contains a second dopant of a second doping type, indirectly or directly at least to the first side of the semiconductor layer, wherein the first and the second doping type are opposite; C) by the effect of heat, simultaneously driving the second dopant from the doping layer into the semiconductor layer and performing one or more of the processes of at least partially activating the implanted dopant in the implantation region and/or performing at least partial recovery of crystal damage in the semiconductor layer, which crystal damage was produced by the implantation, and/or driving in the first dopant from the implantation region.
申请公布号 WO2016023780(A1) 申请公布日期 2016.02.18
申请号 WO2015EP67842 申请日期 2015.08.03
申请人 FRAUNHOFER-GESELLSCHAFT ZUR FÖRDERUNG DER ANGEWANDTEN FORSCHUNG E. V. 发明人 HERMLE, MARTIN;REICHEL, CHRISTIAN;BENICK, JAN;MÜLLER, RALPH;SCHROF, JULIAN
分类号 H01L21/225;H01L21/265;H01L21/266;H01L31/18 主分类号 H01L21/225
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