发明名称 INTERCONNECT STRUCTURE
摘要 An interconnect structure and fabrication method are provided. A substrate can include a semiconductor device disposed therein. A porous dielectric layer can be formed on the substrate. A surface treatment can be performed to the porous dielectric layer to form an isolation layer on the porous dielectric layer to prevent moisture absorption of the porous dielectric layer. An interconnect can be formed at least through the isolation layer and the porous dielectric layer to provide electrical connection to the semiconductor device disposed in the substrate.
申请公布号 US2016049365(A1) 申请公布日期 2016.02.18
申请号 US201514838604 申请日期 2015.08.28
申请人 Semiconductor Manufacturing International (Shanghai) Corporation 发明人 ZHOU MING
分类号 H01L23/522;H01L23/29;H01L23/532;H01L23/31;H01L23/528 主分类号 H01L23/522
代理机构 代理人
主权项
地址 Shanghai CN