发明名称 APPARATUS AND METHOD OF TREATING SURFACE OF SEMICONDUCTOR SUBSTRATE
摘要 In one embodiment, an apparatus of treating a surface of a semiconductor substrate comprises a substrate holding and rotating unit, first to fourth supplying units, and a removing unit. A substrate holding and rotating unit holds a semiconductor substrate, having a convex pattern formed on its surface, and rotates the semiconductor substrate. A first supplying unit supplies a chemical onto the surface of the semiconductor substrate in order to clean the semiconductor substrate. A second supplying unit supplies pure water to the surface of the semiconductor substrate in order to rinse the semiconductor substrate. A third supplying unit supplies a water repellent agent to the surface of the semiconductor substrate in order to form a water repellent protective film onto the surface of the convex pattern. A fourth supplying unit supplies alcohol, which is diluted with pure water, or acid water to the surface of the semiconductor substrate in order to rinse the semiconductor substrate. A removing unit removes the water repellent protective film with the convex pattern being left.
申请公布号 US2016049289(A1) 申请公布日期 2016.02.18
申请号 US201514925805 申请日期 2015.10.28
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 OGAWA Yoshihiro;KOIDE Tatsuhiko;KIMURA Shinsuke;OKUCHI Hisashi;TOMITA Hiroshi
分类号 H01L21/02;H01L21/311;H01L21/3213 主分类号 H01L21/02
代理机构 代理人
主权项
地址 Tokyo JP