发明名称 SELF-ALIGNED GATE LAST III-N TRANSISTORS
摘要 Techniques related to III-N transistors having self aligned gates, systems incorporating such transistors, and methods for forming them are discussed. Such transistors include a polarization layer between a raised source and a raised drain, a gate between the source and drain and over the polarization layer, and lateral epitaxial overgrowths over the source and drain and having and opening therebetween such that at least a portion of the gate adjacent to the polarization layer is aligned with the opening.
申请公布号 WO2016024960(A1) 申请公布日期 2016.02.18
申请号 WO2014US50826 申请日期 2014.08.13
申请人 INTEL CORPORATION 发明人 THEN, HAN WUI;DASGUPTA, SANSAPTAK;SUNG, SEUNG MOON;GARDNER, SANAZ;RADOSAVLJEVIC, MARKO;CHAU, ROBERT
分类号 H01L29/778 主分类号 H01L29/778
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