发明名称 A BUILT OFF SELF TEST DEVICE FOR HAVING BYPASS FUNCTION USING A RELAY
摘要 The present invention relates to a BOST device having a bypass function using a relay. The device comprises: a device specific adapter (DSA) board (110) on which a test target device (111) is mounted; a test head (120) for testing the test target device; and a core board (130) including an FPGA (131) for a BOST mode operation. Therefore, the device can perform a variety of electrical tests in the BOST device without additional processes.
申请公布号 KR101594947(B1) 申请公布日期 2016.02.17
申请号 KR20150110820 申请日期 2015.08.06
申请人 IT&T 发明人 KIM, SEUNG TAE;LEE, HYUN JU
分类号 G01R31/319;G01R31/02;G01R31/26;G01R31/28;H01L21/66 主分类号 G01R31/319
代理机构 代理人
主权项
地址