发明名称 半導体基板の再生方法、及びSOI基板の作製方法
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor substrate reclaiming method which can obtain a substrate having a highly flat surface with less polishing amount. <P>SOLUTION: The semiconductor substrate reclaiming method comprises: a first step of selectively removing a first damaged semiconductor region with respect to an undamaged semiconductor region by performing on a semiconductor substrate including the undamaged semiconductor region, the first damaged semiconductor region and a second damaged semiconductor region, etching using a mixed liquid containing a substance oxidizing a semiconductor material composing the semiconductor substrate, a substance dissolving the oxidized semiconductor material and a substance controlling an oxidative rate of the semiconductor material and a solution rate of the oxidized semiconductor material; a second step of removing the second damaged semiconductor region by using an alkaline solution; and a third step of performing polishing processing. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP5865057(B2) 申请公布日期 2016.02.17
申请号 JP20110277012 申请日期 2011.12.19
申请人 株式会社半導体エネルギー研究所 发明人 木村 俊介;花岡 一哉;浅田 恭平
分类号 H01L21/02;H01L21/336;H01L27/08;H01L27/12;H01L29/786 主分类号 H01L21/02
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