| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor memory device capable of testing whether a memory formed on the semiconductor memory device is defective at the time of product shipment and determining the cause of the defectiveness by using fewer external terminals, and a test method thereof. <P>SOLUTION: A semiconductor memory device determines whether a memory formed on the semiconductor memory device has responded to a read command; and outputs, if the memory has not responded to the read command, an error code to the outside instead of memory data that is read from the memory. <P>COPYRIGHT: (C)2013,JPO&INPIT |
