Luminescence based spectrometers

摘要

Various embodiments of systems, components, modules, routines, and processes for luminescence based spectral measurement are described herein. In one embodiment, a method for measuring a scintillation property of a sample includes directing an ionizing radiation toward the sample, thereby inducing the sample to produce an emission. The method also includes acquiring a spectral luminescence of the produced emission by the sample, the spectral luminescence including a plurality of luminescence intensities at corresponding emission wavelengths or frequencies. The scintillation property of the sample may then be determined based on the acquired spectral luminescence.

主权项

1. A method for determining a scintillation property of a sample, the method comprising: directing an ionizing radiation toward the sample, thereby inducing the sample to produce an emission; acquiring a spectral luminescence of the produced emission by the sample, the spectral luminescence including a plurality of luminescence intensities at corresponding emission wavelengths or frequencies; analyzing the acquired spectral luminescence to determine the following: defects responsible for charge-carrier trapping and/or defects responsible for worsening timing resolution, and thereby determining the scintillation property of the sample based on the acquired spectral luminescence.