| 发明名称 | Test contactor for electrical testing of electronic components | ||
| 摘要 | A testing apparatus for electronic components comprises a mounting block and a plurality of contact strips arranged on the mounting block. The contact strips are configured such that electrical leads of an electronic component are operative to press against and bend the contact strips in a biasing direction to ensure good contact between the electrical leads and the contact strips during testing of the electronic component. Further, a preload block located on the mounting block is operative to contact and apply a pre-stress force onto the contact strips in the biasing direction prior to contact between the electrical leads and the contact strips. | ||
| 申请公布号 | US9261536(B2) | 申请公布日期 | 2016.02.16 |
| 申请号 | US201213584971 | 申请日期 | 2012.08.14 |
| 申请人 | ASM TECHNOLOGY SINGAPORE PTE LTD | 发明人 | Siu Hing Suen;Cheung Yu Sze;Cheng Chi Wah;Lau Kai Fung |
| 分类号 | G01R31/20;G01R31/02;G01R31/26;G01R31/302;H01R11/18;H01R13/00;H05K1/00;G01R1/067;G01R1/04;G01R1/073 | 主分类号 | G01R31/20 |
| 代理机构 | Ostrolenk Faber LLP | 代理人 | Ostrolenk Faber LLP |
| 主权项 | 1. A testing apparatus for electronic components, comprising: a mounting block; a plurality of contact strips arranged on the mounting block and configured such that electrical leads of an electronic component are operative to press against and bend the contact strips in a biasing direction to ensure good contact between the electrical leads and the contact strips during testing of the electronic component; and a preload block located on the mounting block that is operative to contact and apply a pre-stress force onto each of the plurality of contact strips in the same biasing direction prior to contact between the electrical leads and the plurality of contact strips, such that the plurality of contact strips are bent in the same biasing direction. | ||
| 地址 | Singapore SG | ||