发明名称 Shield pin arrangement
摘要 Among other things, one or more techniques and/or systems are provided for shielding a signal pin. A signal pin, such as a signal pin within a probe card used to test electronic devices, such as integrated circuits, is shielded from interference signals, which are emitted from other signal pins within the probe card. Shielding the signal pin mitigates cross-talk issues and/or impendence control issues associated with signals that are carried by the signal pin. In one example, one or more shield pins are arranged with respect to the signal pin according to a shield configuration. For example, the shield configuration comprises a plane of signal pins, a substantially regular layout of signal pins, or a polygonal layout of signal pins, etc. In this way, one or more shield pins inhibit unintended interactions or effects that otherwise occur among two or more signal pins.
申请公布号 US9261534(B2) 申请公布日期 2016.02.16
申请号 US201213559875 申请日期 2012.07.27
申请人 Taiwan Semiconductor Manufacturing Company Limited 发明人 Kuo Yung-Hsin;Huang Po-Yi
分类号 G01R31/00;G01R1/067;G01R1/18;G01R1/073 主分类号 G01R31/00
代理机构 Cooper Legal Group, LLC 代理人 Cooper Legal Group, LLC
主权项 1. A probe card for testing an electronic device comprising: a signal pin configured to carry a signal; a first set of one or more shield pins lying within a first plane; and a second set of one or more shield pins lying within a second plane different than the first plane, the first set and the second set of one or more shield pins configured to shield the signal pin from an interference signal.
地址 Hsin-Chu TW