| 摘要 |
A semiconductor device comprises a first input/output unit and a second input/output unit. The first input/output unit receives first data and is synchronized with an internal clock signal to transfer the first data as first output data or to transfer transfer data generated from second data as the first output data to output through a first pad in response to the control signal. The second input/output unit is synchronized with the internal clock signal to generate the transfer data, and when the second input/output unit is out of a test mode, the second input/output unit is synchronized with the internal clock to transfer the second data as second output data to output through a second pad. Therefore, the semiconductor device can test a plurality of internal circuits, which are installed in a data input/output path, through a shared pad. |
