发明名称 Thin film transistor
摘要 A thin film transistor is provided. The thin film transistor includes a source electrode, a drain electrode, a semiconducting layer, a transition layer, an insulating layer and a gate electrode. The drain electrode is spaced apart from the source electrode. The gate electrode is insulated from the source electrode, the drain electrode, and the semiconductor layer by the insulating layer. The transition layer is sandwiched between the insulating layer and the semiconductor layer. The transition layer is a silicon-oxide cross-linked polymer layer including a plurality of Si atoms. The plurality of Si atoms is bonded with atoms of the insulating layer and atoms of the semiconductor layer.
申请公布号 US9263685(B2) 申请公布日期 2016.02.16
申请号 US201414526455 申请日期 2014.10.28
申请人 Tsinghua University;HON HAI PRECISION INDUSTRY CO., LTD. 发明人 Li Qun-Qing;Zhu Zhen-Dong;Fan Shou-Shan
分类号 H01L21/84;H01L51/05;H01L21/02;H01L51/00 主分类号 H01L21/84
代理机构 Novak Druce Connolly Bove + Quigg LLP 代理人 Novak Druce Connolly Bove + Quigg LLP
主权项 1. A method of making a thin film transistor, the method comprising: forming a gate electrode on an insulating substrate; forming an insulating layer on the gate electrode; forming an HSQ gel layer on the insulating layer; pre-baking the HSQ gel layer to form a HSQ pre-layer; forming a semiconductor layer on the HSQ pre-layer; baking the HSQ pre-layer to form a transition layer after forming the semiconductor layer, wherein a plurality of Si atoms of the transition layer is bonded with atoms of the insulating layer and atoms of the semiconductor layer; and forming a source electrode and a drain electrode spaced from each other and located on the transition layer.
地址 Beijing CN