| 发明名称 | Semiconductor apparatus and test device therefor | ||
| 摘要 | A semiconductor apparatus includes a clock enable signal buffer unit configured to receive an input clock enable signal, and generate an output clock enable signal; a buffer control unit configured to generate a buffer enable signal in response to the output clock enable signal and a test enable signal; an input/output buffer unit configured to receive input patterns and generate output patterns; and a compression test unit configured to test the output patterns and the output clock enable signal according to the test enable signal. | ||
| 申请公布号 | US9261557(B1) | 申请公布日期 | 2016.02.16 |
| 申请号 | US201414532725 | 申请日期 | 2014.11.04 |
| 申请人 | SK Hynix Inc. | 发明人 | Lee Chang Hyun;Ku Young Jun |
| 分类号 | G11C29/00;G01R31/317;G11C7/10;G11C7/22;G11C29/02 | 主分类号 | G11C29/00 |
| 代理机构 | William Park & Associates Ltd. | 代理人 | William Park & Associates Ltd. |
| 主权项 | 1. A semiconductor apparatus comprising: a clock enable signal buffer unit configured to receive an input clock enable signal, and generate an output clock enable signal; a buffer control unit configured to generate a buffer enable signal in response to the output clock enable signal and a test enable signal; an input/output buffer unit configured to receive input patterns and generate output patterns; and a compression test unit configured to test the output patterns and the output clock enable signal according to the test enable signal. | ||
| 地址 | Gyeonggi-do KR | ||