发明名称 Pyrometer process temperature measurement for high power light sources
摘要 A process measurement system for measuring a parameter of a work surface includes a light source configured to provide a material processing beam, an optical delivery system optically coupled to the light source and configured to homogenize and direct the material processing beam to the work surface, the optical delivery system including a process optic for optically coupling the material processing beam to the work surface in a predetermined way, the optical delivery system including a delivery waveguide having an output face optically coupled to the process optic, and an optical pyrometer in optical communication with the optical delivery system and configured to receive a pyrometer signal emitted from the work surface and coupled into said output face.
申请公布号 US9261406(B1) 申请公布日期 2016.02.16
申请号 US201213595935 申请日期 2012.08.27
申请人 nLIGHT Photonics Corporation 发明人 Price R. Kirk;Cannon Scott C.
分类号 G01J5/48;G01J5/00;G01K1/16;G01K11/32;G01K11/00;G01K11/12 主分类号 G01J5/48
代理机构 Klarquist Sparkman, LLP 代理人 Klarquist Sparkman, LLP
主权项 1. A process measurement system for measuring a parameter of a work surface, comprising: a laser light source situated to produce a non-pyrometric material processing beam having an output power of at least 30 W; a homogenizing optical delivery system optically coupled to the laser source and situated to direct the material processing beam to the work surface, said optical delivery system including a process optic situated to optically couple the material processing beam to the work surface in a predetermined way, said optical delivery system also including a delivery waveguide having an output face optically coupled to said process optic; and an optical pyrometer in optical communication with said optical delivery system and situated to receive a pyrometer signal emitted from the work surface and coupled to said output face.
地址 Vancouver WA US