发明名称 Semiconductor device having interconnection line
摘要 Provided is a semiconductor device. The semiconductor device includes an insulating layer extending in a first direction. A first vertical channel pillar is disposed separately from the insulating layer. A first interconnection line extends in a second direction perpendicular to the first direction, and is electrically connected to the first vertical channel pillar. A first bit line extends in the second direction, and crosses over the first interconnection line and the first vertical channel pillar. A first bit contact overlaps the first interconnection line, and electrically connects the first interconnection line to the first bit line. A length of the first bit contact in the second direction is greater than a length of the first bit contact in the first direction.
申请公布号 US9263576(B2) 申请公布日期 2016.02.16
申请号 US201414576257 申请日期 2014.12.19
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 Yun Jang-Gn;Cho Hoo-Sung;Yun Jae-Sun
分类号 H01L21/8242;H01L29/78;H01L23/528;H01L29/36;H01L27/088 主分类号 H01L21/8242
代理机构 F. Chau & Associates, LLC 代理人 F. Chau & Associates, LLC
主权项 1. A semiconductor device, comprising: an insulating layer extending in a first direction; a first vertical channel pillar disposed separately from the insulating layer; a first interconnection line extending in a second direction perpendicular to the first direction, wherein the first interconnection line is electrically connected to the first vertical channel pillar; a first bit line extending in the second direction, wherein the first bit line crosses over the first interconnection line and the first vertical channel pillar; and a first bit contact overlapping the first interconnection line, wherein the first bit contact electrically connects the first interconnection line to the first bit line, and wherein a length of the first bit contact in the second direction is greater than a length of the first bit contact in the first direction.
地址 Suwon-Si, Gyeonggi-Do KR