发明名称 |
Method for selective growth of highly doped group IV—Sn semiconductor materials |
摘要 |
Disclosed are methods for selective deposition of doped Group IV-Sn materials. In some embodiments, the method includes providing a patterned substrate comprising at least a first region and a second region, where the first region includes an exposed first semiconductor material and the second region includes an exposed insulator material, and performing at least two cycles of a grow-etch cyclic process. Each cycle includes depositing a doped Group IV-Tin (Sn) layer, where depositing the doped Group IV-Sn layer includes providing a Group IV precursor, a Sn precursor, and a dopant precursor, and using an etch gas to etch back the deposited doped Group IV-Sn layer. |
申请公布号 |
US9263263(B2) |
申请公布日期 |
2016.02.16 |
申请号 |
US201313944592 |
申请日期 |
2013.07.17 |
申请人 |
IMEC |
发明人 |
Hikavyy Andriy;Vincent Benjamin;Loo Roger |
分类号 |
H01L21/02;H01L21/205 |
主分类号 |
H01L21/02 |
代理机构 |
McDonnell Boehnen Hulbert & Berghoff LLP |
代理人 |
McDonnell Boehnen Hulbert & Berghoff LLP |
主权项 |
1. A method comprising:
providing a patterned substrate comprising at least a first region and a second region, wherein the first region comprises an exposed first semiconductor material and the second region comprises an exposed insulator material; and performing at least two cycles of a grow-etch cyclic process, wherein each cycle comprises:
(i) depositing a doped Group IV-Tin (Sn) layer, wherein a Sn concentration throughout the doped Group IV-Sn layer is at least about 5 at %, wherein depositing the doped Group IV-Sn layer comprises providing a Group IV precursor, a Sn precursor, and a dopant precursor, and(ii) using an etch gas to etch back the deposited doped Group IV-Sn layer. |
地址 |
Leuven BE |