发明名称 半導体装置とその製造方法
摘要 A semiconductor device includes a semiconductor substrate; a first insulating film that is formed over the semiconductor substrate; a capacitor that is formed over the first insulating film and is formed by sequentially stacking a lower electrode, a capacitor dielectric film, and an upper electrode; a second insulating film that is formed over the capacitor and has a hole including the entire region of the upper electrode in plan view; and a conductor plug that is formed in the hole and contains tungsten.
申请公布号 JP5862290(B2) 申请公布日期 2016.02.16
申请号 JP20110287732 申请日期 2011.12.28
申请人 富士通セミコンダクター株式会社 发明人 佐次田 直也
分类号 H01L21/8246;H01L21/8242;H01L27/10;H01L27/105;H01L27/108 主分类号 H01L21/8246
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