发明名称 |
Ohmic contact to semiconductor |
摘要 |
An ohmic contact to a semiconductor layer including a heterostructure barrier layer and a metal layer adjacent to the heterostructure barrier layer is provided. The heterostructure barrier layer can form a two dimensional free carrier gas for the contact at a heterointerface of the heterostructure barrier layer and the semiconductor layer. The metal layer is configured to form a contact with the two dimensional free carrier gas. |
申请公布号 |
US9263538(B2) |
申请公布日期 |
2016.02.16 |
申请号 |
US201113296581 |
申请日期 |
2011.11.15 |
申请人 |
Sensor Electronic Technology, Inc. |
发明人 |
Gaska Remigijus;Shur Michael |
分类号 |
H01L29/45;H01L33/38;H01L33/40 |
主分类号 |
H01L29/45 |
代理机构 |
LaBatt, LLC |
代理人 |
LaBatt, LLC |
主权项 |
1. A patterned structure, comprising:
a plurality of ohmic contacts to a semiconductor layer forming a Bragg reflector, each ohmic contact comprising:
a heterostructure barrier layer located on a first surface of the semiconductor layer, wherein the heterostructure barrier layer forms a two dimensional free carrier gas for the plurality of ohmic contacts at a heterointerface of the heterostructure barrier layer and the semiconductor layer, and wherein the heterostructure barrier layer comprises a graded composition; anda metal layer located adjacent to the heterostructure barrier layer, wherein the metal layer forms a contact with the two dimensional free carrier gas. |
地址 |
Columbia SC US |