发明名称 Ohmic contact to semiconductor
摘要 An ohmic contact to a semiconductor layer including a heterostructure barrier layer and a metal layer adjacent to the heterostructure barrier layer is provided. The heterostructure barrier layer can form a two dimensional free carrier gas for the contact at a heterointerface of the heterostructure barrier layer and the semiconductor layer. The metal layer is configured to form a contact with the two dimensional free carrier gas.
申请公布号 US9263538(B2) 申请公布日期 2016.02.16
申请号 US201113296581 申请日期 2011.11.15
申请人 Sensor Electronic Technology, Inc. 发明人 Gaska Remigijus;Shur Michael
分类号 H01L29/45;H01L33/38;H01L33/40 主分类号 H01L29/45
代理机构 LaBatt, LLC 代理人 LaBatt, LLC
主权项 1. A patterned structure, comprising: a plurality of ohmic contacts to a semiconductor layer forming a Bragg reflector, each ohmic contact comprising: a heterostructure barrier layer located on a first surface of the semiconductor layer, wherein the heterostructure barrier layer forms a two dimensional free carrier gas for the plurality of ohmic contacts at a heterointerface of the heterostructure barrier layer and the semiconductor layer, and wherein the heterostructure barrier layer comprises a graded composition; anda metal layer located adjacent to the heterostructure barrier layer, wherein the metal layer forms a contact with the two dimensional free carrier gas.
地址 Columbia SC US