发明名称 Group III nitride semiconductor light-emitting device
摘要 The present invention provides a Group III nitride semiconductor light-emitting device exhibiting improved emission output. The light-emitting device comprises an n-type contact layer on which an n-electrode is formed, a light-emitting layer, an n-type cladding layer formed between the light-emitting layer and the n-type contact layer. The n-type cladding layer has a structure of at least two layers including a first n-type cladding layer closer to the light-emitting layer and a second n-type cladding layer farther from the light-emitting layer than the first n-type cladding layer. The first n-type cladding layer has a Si concentration higher than that of the second n-type cladding layer, and the first n-type cladding layer has a thickness smaller than that of the second n-type cladding layer.
申请公布号 US9263639(B2) 申请公布日期 2016.02.16
申请号 US201414329809 申请日期 2014.07.11
申请人 Toyoda Gosei Co., Ltd. 发明人 Aoki Masato;Saito Yoshiki
分类号 H01L31/06;H01L21/28;H01L33/30;H01L33/02;H01L33/32;H01L33/00 主分类号 H01L31/06
代理机构 McGinn IP Law Group, PLLC 代理人 McGinn IP Law Group, PLLC
主权项 1. A Group III nitride semiconductor light-emitting device having a plurality of Group III nitride semiconductor layers on a surface of Group III nitride semiconductor substrate, the light-emitting device comprising: an n-type contact layer on which an n-electrode is formed, a light-emitting layer, an n-type cladding layer formed between the light-emitting layer and the n-type contact layer; wherein the n-type cladding layer has a structure of at least two layers including a first n-type cladding layer closer to the light-emitting layer and a second n-type cladding layer farther from the light-emitting layer than the first n-type cladding layer; and the first n-type cladding layer has a Si concentration higher than that of the second n-type cladding layer, and the first n-type cladding layer has a thickness smaller than that of the second n-type cladding layer.
地址 Kiyosu-shi, Aichi-ken JP