发明名称 |
Semiconductor device with one-side-contact and method for fabricating the same |
摘要 |
A method for fabricating a semiconductor device includes forming a first conductive layer doped with an impurity for forming a cell junction over a semiconductor substrate, forming a second layer over the first conductive layer, forming a plurality of active regions by etching the second layer and the first conductive layer, the plurality of the active regions being separated from one another by trenches, forming a side contact connected to a sidewall of the first conductive layer, and forming a plurality of metal bit lines each connected to the side contact and filling a portion of each trench. |
申请公布号 |
US9263575(B2) |
申请公布日期 |
2016.02.16 |
申请号 |
US201213714107 |
申请日期 |
2012.12.13 |
申请人 |
SK Hynix Inc. |
发明人 |
Lee Jin-Ku;Lee Young-Ho;Lee Mi-Ri |
分类号 |
H01L29/66;H01L29/78;H01L21/285;H01L27/108 |
主分类号 |
H01L29/66 |
代理机构 |
IP & T Group LLP |
代理人 |
IP & T Group LLP |
主权项 |
1. A semiconductor device, comprising:
a plurality of active regions, each configured to have a first sidewall and a second sidewall, the plurality of the active regions being separated from one another by trenches; a side contact configured to be connected to the first sidewall; a cell junction formed at a portion of each active region on the side of the first sidewall to be connected to the side contact; a diffusion barrier region formed at a portion of each active region on the side of the second sidewall; and metal bit lines, each configured to be connected to the side contact and fill a portion of each trench, wherein the diffusion barrier region is counter-doped with an impurity which is different from an impurity doping the cell junction, wherein the active regions have a stacked structure of a first conductive layer pattern with the cell junction and the diffusion barrier region formed therein and a second conductive layer pattern formed over the first conductive layer pattern. |
地址 |
Gyeonggi-do KR |