发明名称 |
Spectral noise analysis for read head structures |
摘要 |
A testing device tests a magnetic head with a read head structure including a read head element while applying an external magnetic field to the magnetic head. The testing device receives signals from the read head element and processes the signals to generate a spectral power density for the signals. The spectral power density is characterized for at least one frequency range. The characterization of the spectral power density is used to determine a characteristic of noise from the read head structure. The signals from the read head may be received with different applied magnetic fields and/or before or while thermally exciting the magnetic head. Additionally, a histogram of the signals may be generated and used to determine a second characteristic of the noise. |
申请公布号 |
US9263069(B2) |
申请公布日期 |
2016.02.16 |
申请号 |
US201313794404 |
申请日期 |
2013.03.11 |
申请人 |
Infinitum Solutions, Inc. |
发明人 |
Taratorin Alexander M. |
分类号 |
G11B5/455;G11B5/127;G11B5/02;G11B5/31 |
主分类号 |
G11B5/455 |
代理机构 |
Silicon Valley Patent Group LLP |
代理人 |
Silicon Valley Patent Group LLP |
主权项 |
1. A method of testing a magnetic head with a read head structure including a read head element, the method comprising:
applying an external magnetic field to the magnetic head; receiving signals from the read head element while in the external magnetic field; processing the signals comprising splitting the signals into a plurality of segments and multiplying each segment by a window function to produce a plurality of windowed segmented signals and processing the plurality of windowed segmented signals to generate a spectral power density for the signals; characterizing the spectral power density for at least one frequency range; and using the characterization of the spectral power density to determine a characteristic of noise from the read head structure. |
地址 |
Santa Clara CA US |