发明名称 |
Method of testing secondary battery |
摘要 |
A method of testing a secondary battery includes step A of charging the secondary battery to a predetermined charge voltage, step B of setting aside the secondary battery for a predetermined time (tb) after the step A, step C of discharging the secondary battery to a predetermined discharge voltage after the step B, and step D of detecting a battery voltage increase for a preset time (t2) after a predetermined time (t1) has elapsed after the step C. This method of testing a secondary battery can evaluate a measurement of how much the negative electrode active material layer covers the positive electrode active material layer based on the battery voltage increase detected in the step D. |
申请公布号 |
US9261565(B2) |
申请公布日期 |
2016.02.16 |
申请号 |
US201114343496 |
申请日期 |
2011.09.09 |
申请人 |
Toyota Jidosha Kabushiki Kaisha |
发明人 |
Hamaguchi Hiroshi |
分类号 |
G01N27/416;H01M10/48;G01R31/36;H01M10/0587;H01M10/0525;H01M10/44;H01M10/42 |
主分类号 |
G01N27/416 |
代理机构 |
Finnegan, Henderson, Farabow, Garrett & Dunner, LLP |
代理人 |
Finnegan, Henderson, Farabow, Garrett & Dunner, LLP |
主权项 |
1. A method of testing a secondary battery including:
a positive electrode current collector; a positive electrode active material layer retained on the positive electrode current collector; a negative electrode current collector; and a negative electrode active material layer retained on the negative electrode current collector and disposed so as to oppose the positive electrode active material layer, the negative electrode active material layer being wider than the positive electrode active material layer and disposed so as to cover the positive electrode active material layer, the method comprising: step A of charging the secondary battery to a predetermined charge voltage; step B of setting aside the secondary battery for a predetermined time after the step A; step C of discharging the secondary battery to a predetermined discharge voltage after the step B; and step D of detecting a battery voltage increase for a preset time after a predetermined time has elapsed after the step C. |
地址 |
Toyota-shi, Aichi JP |