| 发明名称 | Probe | ||
| 摘要 | A surface profile measurement probe comprising two spaced apart points 20 for contacting a convex surface to be measured and a straight edge or surface 22 moveable relative to the two points to enable the straight edge to be brought into contact with a convex surface contacted by the two points. A tip 10 protrudes from and is moveably mounted relative to the straight edge or surface for measuring the profile of a surface contacted by the straight edge. | ||
| 申请公布号 | US9261345(B2) | 申请公布日期 | 2016.02.16 |
| 申请号 | US201313972740 | 申请日期 | 2013.08.21 |
| 申请人 | Elcometer Limited | 发明人 | Morley Colin John;Whitaker John Michael;Sellars Michael Carrington |
| 分类号 | G01B5/20;G01B5/28;G01B7/34 | 主分类号 | G01B5/20 |
| 代理机构 | Leydig, Voit & Mayer, Ltd | 代理人 | Leydig, Voit & Mayer, Ltd |
| 主权项 | 1. A surface roughness measurement probe comprising two spaced apart points for contacting a convex surface to be measured, at least a straight edge moveable relative to the two points to enable the straight edge to be brought into contact with a convex surface contacted by the two points and a tip protruding from and moveably mounted relative to the straight edge for measuring the surface roughness of a surface contacted by the straight edge. | ||
| 地址 | Manchester GB | ||