| 发明名称 | Semiconductor device with pass/fail circuit | ||
| 摘要 | A semiconductor device includes a memory block including memory cells coupled to word lines, and an operation circuit suitable for performing a program operation and a verify operation on memory cells coupled to a selected word line, wherein, when performing the program operation, the operation circuit applies a first program allowance voltage to a bit line of a first program fail cell to keep a program fall status, and a second program allowance voltage having a voltage level different from the first program allowance voltage to a bit line of a second program fail cell to change a program pass status to a program fail status. | ||
| 申请公布号 | US9263148(B2) | 申请公布日期 | 2016.02.16 |
| 申请号 | US201414572071 | 申请日期 | 2014.12.16 |
| 申请人 | SK Hynix Inc. | 发明人 | An Chi Wook;Lee Min Kyu |
| 分类号 | G11C16/04;G11C16/34;G11C16/12;G11C16/10 | 主分类号 | G11C16/04 |
| 代理机构 | IP & T Group LLP | 代理人 | IP & T Group LLP |
| 主权项 | 1. A semiconductor device, comprising: a memory block including memory cells coupled to word lines; and an operation circuit suitable for performing a program operation and a verify operation on memory cells coupled to a selected word line, wherein, when performing the program operation, the operation circuit applies a first program allowance voltage to a bit line of a first program fail cell, to keep a program fail status, and a second program allowance voltage having a voltage level different from the first program allowance voltage to a bit line of a second program fail cell, to change a program pass status to a program fall status. | ||
| 地址 | Gyeonggi-do KR | ||