发明名称 Technique for imaging using array of focused virtual sources using phased excitation
摘要 The invention relates to a method and a device for detecting, measuring and evaluating defects in an object and/or specific material property of an object using a phased array wave technique. The device comprises of a phased array transceiver probe/source and control unit for use in a phased array wave technique for transmitting and receiving wave signals on and from the area to be inspected. The phased array source is divided into a plurality of virtual probes/sources and each virtual probe/source comprises of plurality of elements arranged sequentially but without phasing for excitation.
申请公布号 US9261486(B2) 申请公布日期 2016.02.16
申请号 US201113575231 申请日期 2011.01.28
申请人 INDIAN INSTITUTE OF TECHNOLOGY 发明人 Balasubramaniam Krishnan;Alavudeen Saivathan;Krishnamurthy Chitti Venkatta
分类号 G01N29/06;G01N29/26;G01S7/52;G01S15/89;G01S13/90;G01S17/89 主分类号 G01N29/06
代理机构 Maschoff Brennan, PLLC 代理人 Maschoff Brennan, PLLC
主权项 1. A method for detecting defects/anomalies, measuring and evaluating defects/anomalies in an object/media and/or specific material property of an object/media using a phased array wave technique comprising: a. dividing a phased array transceiver source into a plurality of virtual sources wherein at least one of the virtual sources is characterized in creating a single virtual beam by arranging a plurality of elements in each virtual source sequentially but without phasing for excitation and each element receiving one pulse and the plurality of elements together creating a plurality of beams having same phase and amplitude thereby virtually creating a single beam having a specific angle and focused at a specific depth, b. transmitting and receiving one or more wave signals via the plurality of virtual sources in a controlled manner onto an area to be inspected with a control unit that controls the phased array transceiver source, b1. measuring received one or more wave signals, and c. evaluating with the control unit the defects/anomalies and/or specific material property on the inspected area by manipulation of the measured one or more wave signals of the plurality of virtual sources.
地址 Chennai, State of Tamil Nadu IN