发明名称 |
Technique for imaging using array of focused virtual sources using phased excitation |
摘要 |
The invention relates to a method and a device for detecting, measuring and evaluating defects in an object and/or specific material property of an object using a phased array wave technique. The device comprises of a phased array transceiver probe/source and control unit for use in a phased array wave technique for transmitting and receiving wave signals on and from the area to be inspected. The phased array source is divided into a plurality of virtual probes/sources and each virtual probe/source comprises of plurality of elements arranged sequentially but without phasing for excitation. |
申请公布号 |
US9261486(B2) |
申请公布日期 |
2016.02.16 |
申请号 |
US201113575231 |
申请日期 |
2011.01.28 |
申请人 |
INDIAN INSTITUTE OF TECHNOLOGY |
发明人 |
Balasubramaniam Krishnan;Alavudeen Saivathan;Krishnamurthy Chitti Venkatta |
分类号 |
G01N29/06;G01N29/26;G01S7/52;G01S15/89;G01S13/90;G01S17/89 |
主分类号 |
G01N29/06 |
代理机构 |
Maschoff Brennan, PLLC |
代理人 |
Maschoff Brennan, PLLC |
主权项 |
1. A method for detecting defects/anomalies, measuring and evaluating defects/anomalies in an object/media and/or specific material property of an object/media using a phased array wave technique comprising:
a. dividing a phased array transceiver source into a plurality of virtual sources wherein at least one of the virtual sources is characterized in creating a single virtual beam by arranging a plurality of elements in each virtual source sequentially but without phasing for excitation and each element receiving one pulse and the plurality of elements together creating a plurality of beams having same phase and amplitude thereby virtually creating a single beam having a specific angle and focused at a specific depth, b. transmitting and receiving one or more wave signals via the plurality of virtual sources in a controlled manner onto an area to be inspected with a control unit that controls the phased array transceiver source, b1. measuring received one or more wave signals, and c. evaluating with the control unit the defects/anomalies and/or specific material property on the inspected area by manipulation of the measured one or more wave signals of the plurality of virtual sources. |
地址 |
Chennai, State of Tamil Nadu IN |