发明名称 |
Method of producing α crystal structure-based alumina films |
摘要 |
In forming alumina films on substrates by sputtering of an aluminum metal target in an oxidizing gas-containing atmosphere, film formation is carried out intermittently in a plurality of substeps while restricting a thickness of the film formed in each substep to at most 5 nm. A turntable is disposed to face a direction of sputtering of the aluminum metal target and the substrates are fixed to the turntable. |
申请公布号 |
US9260776(B2) |
申请公布日期 |
2016.02.16 |
申请号 |
US201113114536 |
申请日期 |
2011.05.24 |
申请人 |
Kobe Steel, Ltd. |
发明人 |
Kohara Toshimitsu;Tamagaki Hiroshi;Ikari Yoshimitsu |
分类号 |
C23C14/34;C23C14/00;H01J37/32;C23C14/08 |
主分类号 |
C23C14/34 |
代理机构 |
Oblon, McClelland, Maier & Neustadt, L.L.P. |
代理人 |
Oblon, McClelland, Maier & Neustadt, L.L.P. |
主权项 |
1. A method of producing α crystal structure-based alumina films, comprising the sequential steps of:
performing a first sputtering step of a first alumina film on a substrate, using an aluminum metal target and in an oxidizing gas-containing atmosphere according to a transition sputtering mode arising under conditions existing between a metal sputtering mode and a poisoning sputtering mode, wherein said first sputtering step continues until a thickness of the first film is at most 5 nm; maintaining the substrate in the oxidizing gas-containing atmosphere, without film formation, for a period of time sufficient that the oxidizing gas-containing atmosphere influences the formation of α crystal structure-based alumina; and performing sputtering of a second alumina film on the first film, using an aluminum metal target and in an oxidizing gas-containing atmosphere according to the transition sputtering mode, wherein said second sputtering step continues until a thickness of the second film is at most 5 nm. |
地址 |
Kobe-shi JP |