发明名称 Current detection circuit and semiconductor memory apparatus
摘要 The invention provides a current detection circuit and a semiconductor memory apparatus using the current detection circuit thereof. The current detection circuit is capable of rapidly sensing the current flowing through a tiny bit line structure. A page buffer/sensing circuit of the invention includes: a transistor TP3 pre-charging a node SNS during a pre-charge period and providing a target constant current to the node SNS during a discharge period; a transistor TN3 pre-charging the bit line according to the voltage pre-charged to the node SNS; and a transistor TP2 connected to the node SNS. The transistor TP2 detects whether or not a current larger than the constant current supplied by the transistor TP3 is discharged from the bit line and outputs a detection result to a node SENSE.
申请公布号 US9263145(B2) 申请公布日期 2016.02.16
申请号 US201414537352 申请日期 2014.11.10
申请人 WINBOND ELECTRONICS CORP. 发明人 Arakawa Kenichi
分类号 G11C7/06;G11C16/26;G11C16/04;G11C13/00;G11C7/10;G11C11/22 主分类号 G11C7/06
代理机构 Muncy, Geissler, Olds & Lowe, P.C. 代理人 Muncy, Geissler, Olds & Lowe, P.C.
主权项 1. A current detection circuit, comprising; a first supply circuit which can set a current value to be detected and supply a constant current corresponding to the current value to a first node; a second supply circuit which is connected between the first node and a bit line and can supply the current supplied to the first node to the bit line when the bit line is discharged; and a determination circuit which is connected to the first node to determine whether or not a current that is larger than the constant current supplied by the first supply circuit is discharged from the bit line, wherein the second supply circuit comprises: a MOS transistor connected between the first node and the bit line; and a monitor circuit monitoring the voltage of the bit line, wherein the monitor circuit reduces the impedance of the MOS transistor when the voltage of the bit line decreases.
地址 Taichung TW