发明名称 |
Chromatic confocal system |
摘要 |
A system for determining surface topography of a three-dimensional structure is provided. The system can include an illumination unit configured to output a two-dimensional array of light beams each comprising a plurality of wavelengths. An optical assembly can focus the plurality of wavelengths of each light beam to a plurality of focal lengths so as to simultaneously illuminate the structure over a two-dimensional field of view. A detector and a processor are used to generate data representative of the surface topography of the three-dimensional structure based on the measured characteristics of the light reflected from the structure. |
申请公布号 |
US9261358(B2) |
申请公布日期 |
2016.02.16 |
申请号 |
US201414323225 |
申请日期 |
2014.07.03 |
申请人 |
Align Technology, Inc. |
发明人 |
Atiya Yossef;Verker Tal |
分类号 |
G01B11/25;A61C9/00 |
主分类号 |
G01B11/25 |
代理机构 |
Wilson Sonsini Goodrich & Rosati |
代理人 |
Wilson Sonsini Goodrich & Rosati |
主权项 |
1. A system for measuring surface topography of a three-dimensional structure, the system comprising:
an illumination unit configured to output a two-dimensional array of light beams each comprising a plurality of wavelengths; an optical assembly operatively coupled to the illumination unit and configured to focus the plurality of wavelengths of each light beam to a plurality of focal lengths relative to the optical assembly so as to simultaneously illuminate the structure over a two-dimensional field of view; wherein the plurality of focal lengths is fixed relative to the optical assembly during the measuring of the surface topography; a detector configured to measure a characteristic of light reflected from the structure for each of a plurality of locations distributed in two dimensions over the field of view; and, a processor coupled with the detector and configured to generate data representative of the surface topography of the structure based on the measured characteristics of the light reflected from the structure. |
地址 |
San Jose CA US |