发明名称 RESISTIVE MEMORY DEVICE AND OPERATING METHOD THEREOF
摘要 The present invention relates to a resistive memory device including a plurality of memory cells. The resistive memory device comprises a memory cell array and a bad region management unit. The memory cell array includes a plurality of memory layers vertically stacked. Each of the plurality of memory layers includes a plurality of memory cells arranged in spots where a plurality of first lines and a plurality of second lines cross each other. The bad region management unit defines a first memory layer including a bad cell among the plurality of memory cells and at least one second memory layer as a bad region.
申请公布号 KR20160016454(A) 申请公布日期 2016.02.15
申请号 KR20140100660 申请日期 2014.08.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KWON, HYO JIN;BYEON, DAE SEOK;PARK, HYUN KOOK;YOON, CHI WEON;LEE, YEONG TAEK;LEE, YONG KYU
分类号 G11C29/02 主分类号 G11C29/02
代理机构 代理人
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