System and Method for Testing a Radio Frequency Integrated Circuit

摘要

In an embodiment, a method of testing a radio frequency integrated circuit (RFIC) includes generating high-frequency test signals using the on-chip test circuit, measuring signal levels using on-chip power detectors, and controlling and monitoring the on-chip test circuit using low-frequency signals. The RFIC circuit is configured to operate at high frequencies, and an on-chip test circuit that includes frequency generation circuitry configured to operate during test modes.

主权项

1. A radio frequency integrated circuit (RFIC) comprising:
an RF circuit configured to operate at high frequencies; and an on-chip test circuit comprising:
frequency generation circuitry coupled to the RF circuit, the frequency generation circuitry configured to generate high-frequency test signals during test modes,a power detector coupled to the RF circuit, anda low-frequency test interface coupled to the frequency generation circuit and the power detectors, wherein the low-frequency test interface is configured to control and monitor the on-chip test circuit using low-frequency signals.