TEST FIXTURE WITH THERMOELECTRIC COOLER AND SPRING-OPERATED HOLDING PIN

摘要

A test fixture generally includes a thermoelectric cooler (TEC) configured to regulate the temperature of a device under test (DUT). The test fixture may further include a device carrier configured to secure the DUT in a desired position relative to the TEC and a spring-operated pin configured to generate a desired contact pressure between the DUT and the TEC. The desired contact pressure may be selected to achieve a thermal coupling between the DUT and the TEC that maintains the temperature of the DUT at a desired operation level.

主权项

1. A test fixture comprising:
a thermoelectric cooler (TEC) configured to regulate temperature of a device under test (DUT); a device carrier configured to secure said DUT in a desired position relative to said TEC; and a spring-operated pin configured to generate a desired contact pressure between said DUT and said TEC, wherein said desired contact pressure is associated with a desired thermal coupling between said DUT and said TEC.