发明名称 SEMICONDUCTOR LIGHT EMITTING DEVICE, LIGHT EMITTING DEVICE PACKAGE COMPRISING THE SAME, AND LIGHTING DEVICE COMPRISING THE SAME
摘要 A semiconductor light emitting device includes an n-type semiconductor layer, a border layer disposed on the n-type semiconductor layer, having band gap energy decreasing in a single direction, and represented by an empirical formula AlxInyGa1−x−yN (0≦x≦0.1, 0.01≦y≦0.1), an active layer disposed on the border layer and having a structure in which one or more InGaN layers and one or more GaN layers are alternately stacked, and a p-type semiconductor layer.
申请公布号 US2016043279(A1) 申请公布日期 2016.02.11
申请号 US201514661950 申请日期 2015.03.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JEAN Jai Won;KIM Min Hwan;SIM Eun Deok;LEE Jong Hyun;LEE Heon Ho;LEE Ho Chul;HYUN Jae Sung
分类号 H01L33/32;H01L33/02;H01L33/46;H01L33/14;H01L33/50;H01L33/24;H01L33/00;H01L33/06 主分类号 H01L33/32
代理机构 代理人
主权项 1. A semiconductor light emitting device, comprising: a first conductivity-type semiconductor layer including an n-type GaN contact layer, an n-type GaN layer disposed on the n-type GaN contact layer, doped with silicon (Si) acting as an n-type dopant in a concentration of 2×1018 cm−3 to 9×1019 cm−3, and having a thickness of 1 nm to 500 nm, and an n-type super-lattice layer disposed on the n-type GaN layer and having a structure in which two or more AlxInyGazN (0≦x,y,z≦1, x+y+z>0) having different compositions are repeatedly stacked; a border layer disposed on the first conductivity-type semiconductor layer and having band gap energy decreasing in a direction away from the first conductivity-type semiconductor layer; an active layer contacting the border layer and having a multiple quantum well structure in which five or more quantum well layers and four or more quantum barrier layers are alternately stacked; and a second conductivity-type semiconductor layer including a p-type AlxInyGazN layer (0≦x,y,z≦1, x+y+z>0) disposed on the active layer and having a composition ratio of aluminum (Al) increased or decreased in a direction away from the active layer, and a p-type GaN layer disposed on the p-type AlxInyGazN layer (0≦x,y,z≦1, x+y+z>0), doped with magnesium (Mg) acting as a p-type dopant in a concentration of 1×1018 cm−3 to 9×1021 cm−3, and having a thickness of 30 nm to 150 nm, the concentration of magnesium being increased or decreased in a thickness direction, wherein at least one of the first conductivity-type semiconductor layer, the border layer, the active layer and the second conductivity-type semiconductor layer has a V-shaped distortion containing layer formed thereon.
地址 Suwon-si KR