发明名称 PLASMA STABILITY DETERMINATION METHOD AND PLASMA PROCESSING DEVICE
摘要 In determining the stability of plasma in a plasma processing device that performs plasma processing by turning into plasma a processing gas supplied into a processing container, the method of this invention comprises: detecting, while plasma is being generated inside the processing container, the light emission intensity of the plasma inside the processing container; generating, from the results of light emission intensity detection, a first function representing the relationship between time and light emission intensity; differentiating the first function with respect to time to calculate a derivative and generating a second function from the relationship between the absolute value of the derivative and time; and integrating the second function with respect to time to calculate the integrated value and determining the stability of the plasma on the basis of the calculated integrated value.
申请公布号 WO2016021355(A1) 申请公布日期 2016.02.11
申请号 WO2015JP69521 申请日期 2015.07.07
申请人 TOKYO ELECTRON LIMITED 发明人 MIYAMA, RYOU;WATANABE, NAOTO;NAKAMURA, KOICHIRO
分类号 H05H1/00;H01L21/3065;H05H1/46 主分类号 H05H1/00
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