发明名称 |
PLASMA STABILITY DETERMINATION METHOD AND PLASMA PROCESSING DEVICE |
摘要 |
In determining the stability of plasma in a plasma processing device that performs plasma processing by turning into plasma a processing gas supplied into a processing container, the method of this invention comprises: detecting, while plasma is being generated inside the processing container, the light emission intensity of the plasma inside the processing container; generating, from the results of light emission intensity detection, a first function representing the relationship between time and light emission intensity; differentiating the first function with respect to time to calculate a derivative and generating a second function from the relationship between the absolute value of the derivative and time; and integrating the second function with respect to time to calculate the integrated value and determining the stability of the plasma on the basis of the calculated integrated value. |
申请公布号 |
WO2016021355(A1) |
申请公布日期 |
2016.02.11 |
申请号 |
WO2015JP69521 |
申请日期 |
2015.07.07 |
申请人 |
TOKYO ELECTRON LIMITED |
发明人 |
MIYAMA, RYOU;WATANABE, NAOTO;NAKAMURA, KOICHIRO |
分类号 |
H05H1/00;H01L21/3065;H05H1/46 |
主分类号 |
H05H1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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