| 发明名称 |
DEVICES AND METHODS FOR DETECTING COUNTERFEIT SEMICONDUCTOR DEVICES |
| 摘要 |
Techniques for providing a tamper mechanism for semiconductor devices are disclosed herein. The techniques include, for example, providing at least one die and at least one strain gauge, orienting the at least one strain gauge to the die, forming an encapsulated semiconductor device by encapsulating the die and each strain gauge within a mold compound to maintain respective orientation, and measuring an initial strain value for the at least one strain gauge after forming the encapsulated semiconductor device. |
| 申请公布号 |
US2016043043(A1) |
申请公布日期 |
2016.02.11 |
| 申请号 |
US201514821160 |
申请日期 |
2015.08.07 |
| 申请人 |
The Charles Stark Draper Laboratory, Inc. |
发明人 |
Karpman Maurice S. |
| 分类号 |
H01L23/00;G01L1/18 |
主分类号 |
H01L23/00 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method for providing a tamper mechanism for semiconductor devices, the method comprising:
providing at least one die and at least one strain gauge; orienting the at least one strain gauge relative to the at least one die; forming an encapsulated semiconductor device by encapsulating the at least one die and the at least one strain gauge within a mold compound to maintain respective orientation of the die and each strain gauge; and measuring an initial strain value of the at least one strain gauge after forming the encapsulated semiconductor device. |
| 地址 |
Cambridge MA US |
