ANTIREFLECTIVE FILM AND MANUFACTURING METHOD THEREOF, AND METHOD OF MEASURING REFLECTED LIGHT CHARACTERISTICS OF ANTIREFLECTIVE FILM

摘要

This method involves a laminate preparation step for preparing a laminate (40) comprising a film substrate (20) removably adhered to the second primary surface of a transparent film (10) with an adhesive layer (30) interposed therebetween, an antireflective layer formation step in which an antireflective layer (50) comprising two or more thin films is formed on the first primary surface of the transparent film, and an in-line inspection step in which, after deposition of at least one layer of the thin films constituting the antireflective layer, visible light is irradiated from the first primary surface side of the laminate and the light reflected therefrom is detected. The adhesive layer (30) is a diffusion adhesive layer having a haze of 40% or greater. The antireflective layer formation step and the in-line inspection step are performed continuously while conveying the laminate (40) in one direction. Uniformity is improved by adjusting the deposition conditions of the thin films in the antireflective layer formation step in accordance with the result of detecting the reflected light in the in-line inspection step.