发明名称 METHOD OF REMOVING OXIDE ON SEMICONDUCTOR SURFACE BY LAYER OF SULFUR
摘要 Embodiments of the present disclosure relate generally to a method of passivating and/or removing oxides on a semiconductor surface by using ammonium sulfide, the ammonium sulfide is formed by reacting ammonia and hydrogen sulfide in a semiconductor processing chamber, therefore the ammonium sulfide can be used to clean and remove oxides on a semiconductor surface without the concern of ESH and storage, the ammonium sulfide can also be used to passivate a semiconductor surface by forming a layer of sulfur, and thus preventing the reformation of native oxides, the layer of sulfur can be optionally removed to reduce the thickness of the semiconductor material.
申请公布号 US2016042966(A1) 申请公布日期 2016.02.11
申请号 US201414454606 申请日期 2014.08.07
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 KELLY Andrew Joseph;ONIKI Yusuke
分类号 H01L21/306;H01L21/324 主分类号 H01L21/306
代理机构 代理人
主权项 1. A method for removing an oxide on a semiconductor material comprising: providing ammonia and hydrogen sulfide on a semiconductor surface overlaid with an oxide; reacting the ammonia with the hydrogen sulfide to form an ammonium sulfide; and removing the oxide on the semiconductor surface by the ammonium sulfide.
地址 Hsinchu CN
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