发明名称 |
METHOD OF REMOVING OXIDE ON SEMICONDUCTOR SURFACE BY LAYER OF SULFUR |
摘要 |
Embodiments of the present disclosure relate generally to a method of passivating and/or removing oxides on a semiconductor surface by using ammonium sulfide, the ammonium sulfide is formed by reacting ammonia and hydrogen sulfide in a semiconductor processing chamber, therefore the ammonium sulfide can be used to clean and remove oxides on a semiconductor surface without the concern of ESH and storage, the ammonium sulfide can also be used to passivate a semiconductor surface by forming a layer of sulfur, and thus preventing the reformation of native oxides, the layer of sulfur can be optionally removed to reduce the thickness of the semiconductor material. |
申请公布号 |
US2016042966(A1) |
申请公布日期 |
2016.02.11 |
申请号 |
US201414454606 |
申请日期 |
2014.08.07 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
KELLY Andrew Joseph;ONIKI Yusuke |
分类号 |
H01L21/306;H01L21/324 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
1. A method for removing an oxide on a semiconductor material comprising:
providing ammonia and hydrogen sulfide on a semiconductor surface overlaid with an oxide; reacting the ammonia with the hydrogen sulfide to form an ammonium sulfide; and removing the oxide on the semiconductor surface by the ammonium sulfide. |
地址 |
Hsinchu CN |