发明名称 A METHOD OF MODIFYING EPITAXIAL GROWTH SHAPE ON SOURCE DRAIN AREA OF TRANSISTOR
摘要 Methods for forming semiconductor devices, such as FinFETs, are provided. An epitaxial film is formed over a semiconductor fin, and the epitaxial film includes a top surface having two facets. A cap layer is deposited on the top surface, and portions of the epitaxial film in a lateral direction are removed. Having a smaller lateral dimension prevents the epitaxial film from merging with an adjacent epitaxial film and creates a gap between the epitaxial film and the adjacent epitaxial film.
申请公布号 WO2016022260(A1) 申请公布日期 2016.02.11
申请号 WO2015US40425 申请日期 2015.07.14
申请人 APPLIED MATERIALS, INC. 发明人 KIM, YIHWAN;LI, XUEBIN;DUBE, ABHISHEK
分类号 H01L21/336;H01L21/20;H01L29/78 主分类号 H01L21/336
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